Butler Group Instrumentation Communications Test and Measurement JDSU Multiple Application Platform (MAP-200)

JDSU Multiple Application Platform (MAP-200)

  • The JDSU Multiple Application Platform (MAP-200) is an optical test and measurement platform optimised for cost-effective development and manufacturing of optical transmission network elements.
  • Today’s rapidly changing optical market requires investment in productivity-enhancing technologies and tools, making the MAP-200 scalable test platform the right tool needed in even the most stringent environments.
  • Based on the previous-generation Multiple Application Platform (MAP), the MAP-200 builds on the differentiation of offering the broadest portfolio of modules in the densest and most configurable platform.
  • The MAP-200 is optimised for test applications in lab and manufacturing environments ranging from insertion loss testing to dispersion penalty testing.

Key Features

  • Available in three mainframe configurations
  • GPIB- and LXI-compliant (Ethernet)
  • Optional 10.4-inch touch screen display module with integrated keypad and scroll wheel
  • DVI port for external display
  • USB device ports for external keyboard and mouse
  • Hot-swappable module (module can be inserted or removed without powering down)
  • Field replaceable controller/power supply module
  • Compatible with current MAP modules

Contact us:

Aaron Joyce 353 1 6292620

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